EDN

Teradyne packs digital and image testing in parallel tester for CMOS sensors

TOKYO — Teradyne Inc.'s Japan Division today formally launched a new CMOS image sensor tester, which is capable of parallel testing devices with 25-MHz as the measurement frequency and data capture ...
EDN

Teradyne Rolls Out CMOS Image Sensor Test System

Teradyne's Japan Division (JD) today unveiled a CMOS image sensor test system for parallel testing of devices. Teradyne's JD claims to have the largest shipment volume and installed base in the image ...
Digi Times

STAr Technologies introduces MEMS micro-cantilever probe cards for CMOS sensor test

STAr Technologies Inc, a leading supplier of semiconductor test probe cards, today announced the introduction of its new MEMS type micro-Cantilever probe card - STAr Aries Sigma-M, designed and ...
Electronic Design

IRLYNX and CEA-Leti to streamline CMOS infrared sensing

October 21, 2014. IRLYNX and CEA-Leti have announced they have launched a technology-development partnership for a new CMOS-based infrared technology that will allow a new type of smart and connected ...
Electronics Weekly

Agilent Debuts CMOS Test Chip

Agilent Technologies Inc. has embedded more than 50 serializer/deserializer (SerDes)channels in a single CMOS chip, each one operating at 2.5Gbit/sec. The company is claimingthis to be a “breakthrough ...
Electronic Design

Nanusens addresses stiction in CMOS NEMS inertial sensors

Barcelona, Spain. Nanusens has announced that its CMOS nano-sensor technology has been successfully used to solve the problem of stiction in MEMS inertial sensors, which is a major source of failure ...